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Автор: Ivan Padron
Издательство: InTeO
Год издания: 2012
isbn: 9535104049
Количество страниц: 239
Язык: english
Формат: PDF
Размер: 26 Мб
Каталожный номер: 76214
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This book provides a current overview of the theoretical and experimental aspects of some interferometry techniques applied to Topography and Astronomy. Each chapter offers an opportunity to expand the knowledge about interferometry techniques and encourage researchers in development of new interferometry applications. The first two chapters comprise interferometry techniques used for precise measurement of surface topography in engineering applications; while chapters three through eight are dedicated to interferometry applications related to Earth's topography. The last chapter is an application of interferometry in Astronomy, directed specifically to detection of planets outside our solar system.
Ключевые теги: астрономия, космос |
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